Reniers, François; Roose, N.; Silberberg, Eric; Vereecken, Jean. 1996. Study of the chemical bonding in tungsten carbide and chromium films by application of factor analysis on AES depth profiles. . http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/44573.
Status of the publication: Published